Hitachi S3400N
VP SEM

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Key Features

Patented Quad Bias and SE Bias Accelerator Plate Provide Superior Low Voltage Performance for Both High and Variable Pressure Vacuum Conditions

Large Analytical Chamber wtih 5 Axis, Computer Eucentric Stage

New, 5 Segment, Ultra Thin, Backscattered Electron Detector Capable of TV Rate Observation

Fully Automated with One Button Automatic "No Touch" Objective Aperture Alignment

Turbo Molecular Pump (TMP) Provides a Fast and Efficient 90 second Pump Down Time

The S-3400N is Hitachi's newest addition to a world class Variable Pressure SEM line-up. Built on the success of the S-3000 series instruments, the S-3400N offers advances in automation including full filament saturation and "no touch" objective aperture alignment. A new analytical chamber provides a total of ten ports with three high take off angle ports for EDS, Full Focusing WDS, PBS, EBSD, and XRF. A BSE detector allows TV rate scanning and high resolution imaging. Hitachi's patented Quad variable gun bias and SE accelerator plate ensures high currents for low voltage applications now approaching Field Emission performance.