Hitachi AFM5010
Probe Station

Download PDF Brochure

Nanocute exclusive next generation control station for the latest SPM technology. Applicable measurement mode is limited compared to the standard station.

Specifications

 
Real Tune Function Standard equipped
X・Y Scan Voltage ±200V/18bit
Z Scan Voltage ±200V/21bit
Rectangular Scan 1:1, 2:1, 4:1, 8:1, 16:1, 32:1, 64:1, 128:1, 256:1, 512:1, 1024:1
Function
  • Auto Gain Control
  • Z Scan Limiter
Software
  • Easy menu
  • Superimpose Image (Shape/Property)
  • 2 Signal Force Curve Measurement
  • Auto Measurement Recipe Function
  • Data Analysis Batch Processing Function
  • 3D Display Function
  • Surface Roughness Analysis (Rms, Ra, Rms, Elevation Difference, Surface Area)
  • Cross-section Analysis, Average Cross-section Analysis
  • Multi-Function Simultaneous Cross-section Analysis (2 to 4 data support)
  • Surface Roughness JIS Standard (JIS R 1683:2007)
  • Probe Evaluation Function
  • Line Editor Function
  • Auto Cross-section Analysis (Groove width, Pitch, Angle Analysis)
  • Morphology Filter Function
  • Particle Analysis Function (Particle diameter, Particle surface, Particle number)
OS Windows® 7